拇趾外翻X线片观测指标及应用进展 |
摘要点击次数: 2121
全文下载次数: 1748
投稿时间:2012-03-14
|
|
期刊信息:《中国骨伤》2013年,第26卷,第2期,第171-174页 |
DOI:10.3969/j.issn.1003-0034.2013.02.023 |
基金项目: |
|
中文摘要:X线测量是拇外翻畸形最重要的诊断和评价依据之一,选择正确的摄片方式和测量指标对拇外翻畸形的准确诊断和治疗方案的选择均有极其重要的意义.随着对拇外翻病因病理研究的深入,有关该病的X线测量方法和指标也日新月异.摄片的方法包括在负重与非负重状态下拍摄足的正位、侧位、斜位及籽骨轴位片.测量指标的选择也多种多样,包括角度测量、距离测量、籽骨位置的测量等,可作为术前畸形程度及术后疗效的评估.本文基于对国内外有关拇外翻X线测量的最新研究,对其测量方法及应用进行概述. |
【关键词】拇外翻 体层摄影扫描仪,X线计算机 综述文献 |
|
Recent advances in X-ray observation index of hallux valgus and their applications |
|
ABSTRACT X-ray measurement is one of the most important methods for diagnosing hallux valgus. To choose the right photographed way and the proper X-ray observation index has important significance on accurate diagnosis and correct treatment. As the in-depth research on the pathogenesis and pathological changes of hallux valgus,more new X-ray measuring methods and index have appeared. X-ray in the weight-bearing and non-weight-bearing position,dorsoplantar radiograph,lateral radiograph,oblique radiograph and sesamoid radiograph can be taken. Many observation index can be chosen,including angles,distances,the position of sesamoid et al,can be used to evaluate deformity degree before surgery and curative effect after surgery. The following is a summary of the international and domestic recent researches about X-ray observation index of hallux valgus and their applications. |
KEY WORDS Hallux valgus Tomography scanners,X-ray computed Review literature |
|
引用本文,请按以下格式著录参考文献: |
中文格式: | 龚浩,桑志成.拇趾外翻X线片观测指标及应用进展[J].中国骨伤,2013,26(2):171~174 |
英文格式: | GONG Hao,SANG Zhi-cheng.Recent advances in X-ray observation index of hallux valgus and their applications[J].zhongguo gu shang / China J Orthop Trauma ,2013,26(2):171~174 |
|
阅读全文 下载 查看/发表评论 下载PDF阅读器 |
关闭 |
|
|
|